发明名称 Deposition of an electrically insulating thin film with a low dielectric constant
摘要 <p>This invention pertains to a method for forming thin films on substrates wherein the films are produced by applying a solution of an electrically insulating, heat-curing resin onto the substrate, evaporating the solvent and then exposing the resin to high energy radiation to cure the resin. The resin solution contains a substance selected from solvents and gas generating additives that causes dedensification of the film during cure of the resin. This results in a film having a dielectric constant of below 2.7. This invention also pertains to a semiconductor device having an interconnect structure comprising at least one electrically conductive layer with an interposed insulating layer having a dielectric constant of less than 2.7 wherein the insulating layer is produced by the method of this invention. <IMAGE></p>
申请公布号 EP0881668(A3) 申请公布日期 2000.11.15
申请号 EP19980109594 申请日期 1998.05.27
申请人 DOW CORNING TORAY SILICONE COMPANY, LTD. 发明人 KOBAYASHI, AKIHIKO;MINE, KATSUTOSHI;NAKAMURA, TAKASHI;SASAKI, MOTOSHI;SAWA, KIYOTAKA
分类号 H01L21/312;H01L21/314;H01L21/316;H01L21/768;H01L23/532;(IPC1-7):H01L21/312 主分类号 H01L21/312
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