发明名称 |
METHOD OF FABRICATING CAPACITOR |
摘要 |
PURPOSE: A method for manufacturing a capacitor is provided to prevent dielectric layers deposited in an adjacent protrusion part when a dielectric layer is deposited in a subsequent process, by etching an outer portion of a protrusion part formed on the surface of a rugged lower electrode to sufficiently guarantee a space for depositing the dielectric layer. CONSTITUTION: An insulating layer(2) is deposited on a substrate(1) having a semiconductor device. A contact hole is formed in the insulating layer to expose a specific region of the semiconductor device formed in the substrate. Polycrystalline silicon is deposited on the resultant structure, and patterned to form a rugged lower electrode(3). The lower electrode is cleaned. A dielectric layer is deposited on the rugged lower electrode. Polycrystalline silicon is deposited on the dielectric layer to form an upper electrode. H2O2, a NH4OH mixture solution and an HF solution are used in the cleaning process.
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申请公布号 |
KR100271643(B1) |
申请公布日期 |
2000.11.15 |
申请号 |
KR19980002669 |
申请日期 |
1998.01.31 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
KIM, SANG-HYUN;JEONG, SANG-CHEOL |
分类号 |
H01L27/06;(IPC1-7):H01L27/06 |
主分类号 |
H01L27/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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