发明名称 METHOD OF FABRICATING CAPACITOR
摘要 PURPOSE: A method for manufacturing a capacitor is provided to prevent dielectric layers deposited in an adjacent protrusion part when a dielectric layer is deposited in a subsequent process, by etching an outer portion of a protrusion part formed on the surface of a rugged lower electrode to sufficiently guarantee a space for depositing the dielectric layer. CONSTITUTION: An insulating layer(2) is deposited on a substrate(1) having a semiconductor device. A contact hole is formed in the insulating layer to expose a specific region of the semiconductor device formed in the substrate. Polycrystalline silicon is deposited on the resultant structure, and patterned to form a rugged lower electrode(3). The lower electrode is cleaned. A dielectric layer is deposited on the rugged lower electrode. Polycrystalline silicon is deposited on the dielectric layer to form an upper electrode. H2O2, a NH4OH mixture solution and an HF solution are used in the cleaning process.
申请公布号 KR100271643(B1) 申请公布日期 2000.11.15
申请号 KR19980002669 申请日期 1998.01.31
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 KIM, SANG-HYUN;JEONG, SANG-CHEOL
分类号 H01L27/06;(IPC1-7):H01L27/06 主分类号 H01L27/06
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