发明名称 |
METHOD FOR MANUFACTURING CONTACT OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a contact of a semiconductor device is provided to form a finer cell pad contact, by forming a groove having a spacer in a desired region for the cell pad contact, by forming an opening for the cell pad contact through the groove, and by filling the opening with a conductive material. CONSTITUTION: An interlayer dielectric(112) is formed on a semiconductor substrate(100) having an access transistor. The interlayer dielectric is etched by a predetermined thickness to form a groove of a predetermined depth in a desired position for a contact. After a sidewall insulating layer(120) is formed inside the groove, the interlayer dielectric is completely etched along a pattern of the groove having the sidewall insulating layer to form a contact hole covering a predetermined region of the semiconductor substrate. A fine contact is completed by filling up the contact hole with a conductive layer.
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申请公布号 |
KR20000067132(A) |
申请公布日期 |
2000.11.15 |
申请号 |
KR19990014667 |
申请日期 |
1999.04.23 |
申请人 |
SAMSUNG ELECTRONICS CO, LTD. |
发明人 |
KWON, SEONG UN;SHIN, CHEOL HO;YOO, BYEONG DEOK;JUN, JEONG SIK |
分类号 |
H01L21/82;(IPC1-7):H01L21/82 |
主分类号 |
H01L21/82 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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