发明名称 METHOD FOR MANUFACTURING CONTACT OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a contact of a semiconductor device is provided to form a finer cell pad contact, by forming a groove having a spacer in a desired region for the cell pad contact, by forming an opening for the cell pad contact through the groove, and by filling the opening with a conductive material. CONSTITUTION: An interlayer dielectric(112) is formed on a semiconductor substrate(100) having an access transistor. The interlayer dielectric is etched by a predetermined thickness to form a groove of a predetermined depth in a desired position for a contact. After a sidewall insulating layer(120) is formed inside the groove, the interlayer dielectric is completely etched along a pattern of the groove having the sidewall insulating layer to form a contact hole covering a predetermined region of the semiconductor substrate. A fine contact is completed by filling up the contact hole with a conductive layer.
申请公布号 KR20000067132(A) 申请公布日期 2000.11.15
申请号 KR19990014667 申请日期 1999.04.23
申请人 SAMSUNG ELECTRONICS CO, LTD. 发明人 KWON, SEONG UN;SHIN, CHEOL HO;YOO, BYEONG DEOK;JUN, JEONG SIK
分类号 H01L21/82;(IPC1-7):H01L21/82 主分类号 H01L21/82
代理机构 代理人
主权项
地址