发明名称 |
METHOD FOR MANUFACTURING DYNAMIC RANDOM ACCESS MEMORY DEVICE |
摘要 |
PURPOSE: A method for manufacturing a dynamic random access memory(DRAM) device is provided to prevent a storage electrode conductive layer from remaining in a frame region, by forming a contact plug. CONSTITUTION: A conductive layer pattern(22) is formed on a semiconductor substrate(21). A first interlayer dielectric(23) is formed on the semiconductor substrate and conductive layer pattern to expose a central portion of the upper surface of the conductive layer pattern. A contact plug(24) is formed on the first interlayer dielectric and conductive layer pattern. The contact plug is polished by a chemical mechanical polishing(CMP) process until the first interlayer dielectric is exposed. A second interlayer dielectric(26), a sacrificial oxidation layer(28) and a storage electrode conductive layer are sequentially formed. The storage electrode conductive layer is eliminated by a CMP process.
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申请公布号 |
KR20000066954(A) |
申请公布日期 |
2000.11.15 |
申请号 |
KR19990014394 |
申请日期 |
1999.04.22 |
申请人 |
HYUNDAI ELECTRONICS IND. CO.,LTD |
发明人 |
HUH, MIN |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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