发明名称 METHOD FOR MANUFACTURING DYNAMIC RANDOM ACCESS MEMORY DEVICE
摘要 PURPOSE: A method for manufacturing a dynamic random access memory(DRAM) device is provided to prevent a storage electrode conductive layer from remaining in a frame region, by forming a contact plug. CONSTITUTION: A conductive layer pattern(22) is formed on a semiconductor substrate(21). A first interlayer dielectric(23) is formed on the semiconductor substrate and conductive layer pattern to expose a central portion of the upper surface of the conductive layer pattern. A contact plug(24) is formed on the first interlayer dielectric and conductive layer pattern. The contact plug is polished by a chemical mechanical polishing(CMP) process until the first interlayer dielectric is exposed. A second interlayer dielectric(26), a sacrificial oxidation layer(28) and a storage electrode conductive layer are sequentially formed. The storage electrode conductive layer is eliminated by a CMP process.
申请公布号 KR20000066954(A) 申请公布日期 2000.11.15
申请号 KR19990014394 申请日期 1999.04.22
申请人 HYUNDAI ELECTRONICS IND. CO.,LTD 发明人 HUH, MIN
分类号 H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/8242
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