发明名称 NON-VOLATILE MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 PURPOSE: A non-volatile memory device and a method for manufacturing the same are provided to prevent the growth of an uneven oxide layer between trapping sites and an insulating layer by forming an insulating layer on a peripheral area. CONSTITUTION: A non-volatile memory device comprises a first gate insulating layer and a second gate insulating layer. The first gate insulating layer is used for a memory cell device formed on a cell area. The second gate insulating layer is used for a memory cell drive device formed on a peripheral circuit area. A nitrogen atom is contained in the first and the second gate insulating layers. A method for manufacturing the same comprises the steps of: setting up a substrate(40) as a cell area and a peripheral circuit area; setting up the peripheral circuit area as an area for forming a high voltage transistor and an area for forming a low voltage transistor; forming a first gate insulating layer on the area for forming the high voltage transistor; and forming a second gate insulating layer on the cell area.
申请公布号 KR20000065599(A) 申请公布日期 2000.11.15
申请号 KR19990012025 申请日期 1999.04.07
申请人 SAMSUNG ELECTRONICS CO, LTD. 发明人 KIM, JONG HAN;LEE, HEON GYU;CHOI, JEONG HYEOK
分类号 H01L27/115;(IPC1-7):H01L27/115 主分类号 H01L27/115
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