发明名称 |
NON-VOLATILE MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PURPOSE: A non-volatile memory device and a method for manufacturing the same are provided to prevent the growth of an uneven oxide layer between trapping sites and an insulating layer by forming an insulating layer on a peripheral area. CONSTITUTION: A non-volatile memory device comprises a first gate insulating layer and a second gate insulating layer. The first gate insulating layer is used for a memory cell device formed on a cell area. The second gate insulating layer is used for a memory cell drive device formed on a peripheral circuit area. A nitrogen atom is contained in the first and the second gate insulating layers. A method for manufacturing the same comprises the steps of: setting up a substrate(40) as a cell area and a peripheral circuit area; setting up the peripheral circuit area as an area for forming a high voltage transistor and an area for forming a low voltage transistor; forming a first gate insulating layer on the area for forming the high voltage transistor; and forming a second gate insulating layer on the cell area.
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申请公布号 |
KR20000065599(A) |
申请公布日期 |
2000.11.15 |
申请号 |
KR19990012025 |
申请日期 |
1999.04.07 |
申请人 |
SAMSUNG ELECTRONICS CO, LTD. |
发明人 |
KIM, JONG HAN;LEE, HEON GYU;CHOI, JEONG HYEOK |
分类号 |
H01L27/115;(IPC1-7):H01L27/115 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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