SYSTEM AND METHOD FOR SIMULTANEOUSLY MEASURING CRYSTAL STRUCTURE DATA AND CONSTITUENT ELEMENT DATA

摘要

PROBLEM TO BE SOLVED: To provide a system and a method which can simply and speedily measure a crystal structure data and a constituent element data of an unknown crystalline sample by one operation. SOLUTION: The system is equipped with an x-ray source 1 which emits an x-ray beam applied to a measured sample 3, a beam forming means 2 which forms an x-ray beam from an x-ray source 1, a jig which holds the measured sample 3, a direct image pickup type x-ray CCD camera which is arranged so that an x-ray diffraction image from the measured sample 3 and a fluorescent x-ray which is generated by x-rays made incident on the sample 3 may simultaneously enter, a removal means for an unnecessary fluorescent x-ray which prevents an unnecessary fluorescent x-ray from comming incident on a CCD chip 6 in a CCD camera. The system is a measuring system which simultaneously measures a crystal structure data and a constitutive element data of the measured sample 3.