发明名称 DIFFUSION BLOCKING LAYER OF SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A method for manufacturing a diffusion blocking layer of a semiconductor device is provided to prevent impurities from diffusing by the diffusion blocking layer. CONSTITUTION: A lower thin film(30) is formed on an inner wall of a contact hole(20). The lower thin film is plasma-processed. A diffusion blocking layer(40) is formed on the lower thin film. The diffusion blocking layer is formed by a metal organic chemical vapor deposition process in which one of tetra-kisdimethyl amino titanium(TDMAT), tetra-kis diethyl amino titanium(TDEAT), penta dimethyl amino tantalium(PDMAT) and penta diethyl amino tantalium (PDEAT) is used as a source material.
申请公布号 KR20000065373(A) 申请公布日期 2000.11.15
申请号 KR19990011591 申请日期 1999.04.02
申请人 HYUNDAI MICRO ELECTRONICS CO.,LTD. 发明人 HWANG, SUN HONG
分类号 H01L21/768;H01L21/28;H01L21/318;(IPC1-7):H01L21/318 主分类号 H01L21/768
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