发明名称 |
DIFFUSION BLOCKING LAYER OF SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A method for manufacturing a diffusion blocking layer of a semiconductor device is provided to prevent impurities from diffusing by the diffusion blocking layer. CONSTITUTION: A lower thin film(30) is formed on an inner wall of a contact hole(20). The lower thin film is plasma-processed. A diffusion blocking layer(40) is formed on the lower thin film. The diffusion blocking layer is formed by a metal organic chemical vapor deposition process in which one of tetra-kisdimethyl amino titanium(TDMAT), tetra-kis diethyl amino titanium(TDEAT), penta dimethyl amino tantalium(PDMAT) and penta diethyl amino tantalium (PDEAT) is used as a source material.
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申请公布号 |
KR20000065373(A) |
申请公布日期 |
2000.11.15 |
申请号 |
KR19990011591 |
申请日期 |
1999.04.02 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO.,LTD. |
发明人 |
HWANG, SUN HONG |
分类号 |
H01L21/768;H01L21/28;H01L21/318;(IPC1-7):H01L21/318 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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