发明名称 Method for forming metal line of semiconductor device
摘要 A method for forming a metal line of a semiconductor device is suitable for forming a conductive material with strong connection force, by irradiating the region between metals to be connected with each other, with laser beams. It comprises the steps of: forming a plurality of metal lines on a substrate; depositing a first conductive material over the substrate including the metal lines; irradiating the first conductive material between the metal lines to be connected, with laser beams, before forming a second conductive material; and removing the first conductive material excluding the second conductive material.
申请公布号 US6146999(A) 申请公布日期 2000.11.14
申请号 US19970956387 申请日期 1997.10.23
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. 发明人 KANG, DONG MAN;KANG, JUNG HO
分类号 H01L21/28;H01L21/285;H01L21/3205;H01L21/768;H01L23/525;H01L23/532;(IPC1-7):H01L21/82;H01L21/44 主分类号 H01L21/28
代理机构 代理人
主权项
地址
您可能感兴趣的专利