发明名称 |
Method for forming metal line of semiconductor device |
摘要 |
A method for forming a metal line of a semiconductor device is suitable for forming a conductive material with strong connection force, by irradiating the region between metals to be connected with each other, with laser beams. It comprises the steps of: forming a plurality of metal lines on a substrate; depositing a first conductive material over the substrate including the metal lines; irradiating the first conductive material between the metal lines to be connected, with laser beams, before forming a second conductive material; and removing the first conductive material excluding the second conductive material.
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申请公布号 |
US6146999(A) |
申请公布日期 |
2000.11.14 |
申请号 |
US19970956387 |
申请日期 |
1997.10.23 |
申请人 |
HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. |
发明人 |
KANG, DONG MAN;KANG, JUNG HO |
分类号 |
H01L21/28;H01L21/285;H01L21/3205;H01L21/768;H01L23/525;H01L23/532;(IPC1-7):H01L21/82;H01L21/44 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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