发明名称 SIMULATOR FOR SEMICONDUCTOR TEST DEVICE, AND RECORDING MEDIUM STORING SIMULATION PROGRAM
摘要 PROBLEM TO BE SOLVED: To provide a simulator for a semiconductor test device to allow maintenance for a soft ware used in a semiconductor testing system even when no actual equipment exists. SOLUTION: A simulator main body 1 simulates movement of a tester device for testing a semiconductor. An input processing part 10 receives a command input by an operator to be output to a command analyzing processing part 11. The analyzing processing part 11 analyzes the input command to determine whether it is a control command or a test condition setting command, and a test condition assigned by the command is stored when it is the test condition setting command. The command analizing processing part 11 outputs the control command to the simulator main body 1 through a communication processing part 13, and outputs also the test condition when the control command is a test start instruction. The processing part 11 controls further an output processing part 12 to display the image same to an image displayed on an operation device, in response to the input command and a response fed back from the simulator main body 1.
申请公布号 JP2000314763(A) 申请公布日期 2000.11.14
申请号 JP19990125372 申请日期 1999.04.30
申请人 ANDO ELECTRIC CO LTD 发明人 ONO TAKAHIDE
分类号 G06F11/26;G01R31/28;(IPC1-7):G01R31/28 主分类号 G06F11/26
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