发明名称 Projection measuring instrument
摘要 A projection measuring instrument requiring no exchange work of overlay chart for comparatively observing a workpiece image and a template is provided. For the object, a table (56) for a workpiece (55) to be put on, an observation optical system having a screen (1) and a projection lens (53) for projecting an image of the workpiece (55) onto the screen (1), a relative movement unit (57) for relatively moving the table (56) and the observation optical system, and a displacement sensor (61) for detecting relative movement displacement by the relative movement unit (57) are provided, the screen (1) being a liquid crystal display, the liquid crystal display having a display controller (2) for displaying a line drawing for measuring a profile of the workpiece (55) onto the liquid crystal display at a predetermined magnification.
申请公布号 US6147758(A) 申请公布日期 2000.11.14
申请号 US20000490780 申请日期 2000.01.24
申请人 MITUTOYO CORPORATION 发明人 OKABE, KENJI;WATABE, HIROSHI;NAKAMURA, TAIZO
分类号 G01B9/08;G01B11/24;(IPC1-7):G01B11/30 主分类号 G01B9/08
代理机构 代理人
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