发明名称 Semiconductor workpiece cleaning method and apparatus
摘要 A semiconductor workpiece cleaning apparatus includes a cleaning arrangement that cleans a semiconductor workpiece by use of a cleaning liquid, a charging arrangement that brings into a chamber a drying liquid, and a discharging arrangement that discharges the cleaning liquid. The cleaning arrangement cleans the workpiece by spraying chemical liquid and/or pure water in the chamber, and by immersing the workpiece in the chemical liquid and/or pure water. The charging arrangement takes in the drying chemical liquid or vapor so as to contact the processing chemical liquid or pure water in which the semiconductor workpiece is immersed. The discharging arrangement discharges the processing chemical liquid or pure water while preserving an interface between the processing chemical liquid or pure water and the drying chemical liquid or vapor.
申请公布号 US6145519(A) 申请公布日期 2000.11.14
申请号 US19970857364 申请日期 1997.05.15
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 KONISHI, TOKO;BAN, COZY
分类号 H01L21/304;B08B3/02;B08B3/08;B08B3/10;B08B3/12;H01L21/00;H01L21/306;(IPC1-7):B08B7/04 主分类号 H01L21/304
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