| 摘要 |
PROBLEM TO BE SOLVED: To provide a database for designing an integrated circuit device in which a test strategy is stored at a state that it can be optimized and a designing method to optimize the test strategy. SOLUTION: When a designing request is made, VC in an RT layer (RT-VC) and a fault inspection system are selected from a VCDB(virtual core design system) 100 by a fault inspection strategy optimizing means 800. Requested specification (such as area, the number of pins, test time, priorities and restricted weighting information) of a system LSI and VC information, etc., are included in the designing request. An optimizing operation in consideration of various parameters is performed, the optimal fault inspection strategy and one chip fault inspection control circuit are generated by the fault inspection strategy optimizing means 800. Plural VCs with the same function and mutually different test technique are stored in the VCDB 100, the test technique to minimize the total test cost is selected by weighting a parameter to affect the test cost according to a user's priority order. |
