发明名称 |
SEMICONDUCTOR DEVICE AND FABRICATION THEREOF |
摘要 |
<p>PROBLEM TO BE SOLVED: To ensure a sufficient retaining capacity even if the pixel area per unit pixel is decreased by forming an organic insulation film on an insulated gate field effect transistor, forming a light shielding layer thereon and forming a retaining capacity of a dielectric layer coming into tight contact with the light shielding layer and a light reflecting electrode. SOLUTION: A passivation 133 is formed of single crystal silicon having relatively high resistance on a substrate and an organic resin insulation layer 134 is formed of polyimide, or the like. A light shielding layer 135 is then formed thereon using a film containing an element selected from aluminum, titanium or tantalum. In order to form a retaining capacitor employing the light shielding film as one electrode and a pixel electrode 139 as the other electrode in a pixel part, a dielectric layer 136 is formed on the light shielding layer 135 using a silicon oxide or nitride film. Since a retaining capacitor is formed of a dielectric layer coming into tight contact with a light shielding film and a pixel electrode arranged to be lapped partially over the light shielding film, high speed operation is realized with low power consumption.</p> |
申请公布号 |
JP2000315734(A) |
申请公布日期 |
2000.11.14 |
申请号 |
JP20000057782 |
申请日期 |
2000.03.02 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI;MURAKAMI TOMOHITO;ARAI YASUYUKI |
分类号 |
G02F1/13;G02F1/136;G02F1/1368;G09F9/30;H01L21/336;H01L21/8234;H01L27/088;H01L27/32;H01L29/786;(IPC1-7):H01L21/823 |
主分类号 |
G02F1/13 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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