发明名称 METHOD FOR MEASURING GLOSSINESS OF OBJECT SURFACE
摘要 PROBLEM TO BE SOLVED: To measure glossiness with simple constitution and low cost by extracting two current values corresponding to components of proper reflection and scattered reflection lights and comparing them. SOLUTION: The light from a light source 1 is focused with a condenser lens in a spot light state for casting on a specimen to be measured 3 and a half of the reflection light from the specimen surface is passed through a 1/2 wave length plate (phase difference film) 4 and a polarizing plate 5 and the remaining half is passed only through the polarizing plate 5 to introduce in a position detection sensor(PSD) 6. The PSD 6 introduces in the right region the reflection light consisting of proper reflection light and scattered reflection light having passed only the polarizing plate 5 and introduces in the left region the reflection light of only scattered light having passed both the 1/2 wave length plate and the polarizing plate 5. By processing the current determined by irradiation light quantity of these reflection light, irradiation position and the inter-electrode resistance and the like of the PSD 6 and obtaining a voltage corresponding to the reflection light quantity, glossiness of the specimen surface is measured with the degree of the voltage.
申请公布号 JP2000314658(A) 申请公布日期 2000.11.14
申请号 JP19990123053 申请日期 1999.04.28
申请人 NICHICON CORP 发明人 NAKANISHI RAITA
分类号 G01J1/02;G01N21/21;G01N21/57;(IPC1-7):G01J1/02 主分类号 G01J1/02
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