发明名称 APPARATUS FOR MEASURING CHARACTERISTIC OF FLUORESCENT SUBSTANCE
摘要 PURPOSE: Apparatus for measuring a characteristic of a fluorescent substance is provided to enhance a reliability of a characteristic test of the fluorescent substance and enhances a measuring level of the fluorescent substance. CONSTITUTION: Apparatus for measuring a characteristic of a fluorescent substance includes a vacuum chamber(21), electron gun(22), a deviation coil(25) and focus coil(24), a demountable mount, and a photodiode cell(26). The electron gun has a cathode for emitting electron beam, illuminates the electron beam on a fluorescent substance mounted to one side of the vacuum chamber, and is mounted to the other side of the vacuum chamber to be faced to the fluorescent substance. The deviation coil and the focus coil are mounted to a circumference of the vacuum chamber, and thus the electron beam is collected on a point before the sample. The demountable mount is mounted to one side of the fluorescent sample. At least one photodiode cell is mounted to one side of the demountable mount, and measures an optical characteristic of the fluorescent sample.
申请公布号 KR20000066312(A) 申请公布日期 2000.11.15
申请号 KR19990013321 申请日期 1999.04.15
申请人 SAMSUNG SDI CO., LTD. 发明人 BAE, JAE U
分类号 G01N33/26;(IPC1-7):G01N33/26 主分类号 G01N33/26
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