发明名称
摘要 PROBLEM TO BE SOLVED: To provide a chemical mechanical polishing work method capable of flatening a workpiece surface in a high degree to an extent with no abnormal protrusion on the surface. SOLUTION: In this polishing work method, a polishing tape T formed with a polishing layer fixing cerium oxide powder as an abrasive grain on a tape board having flexibility is pressed to a surface of a workpiece while supplying a solution L having hydroxyl group to the surface of the workpiece D and made to run. The solution L supplied to the surface of the workpiece D is a solution having a hydroxyl group of potassium hydroxide solution, sodium hydroxide solution, cesium hydroxide solution, etc. The workpiece D is made of metal or glass, preferably a glass-made or aluminum-made disk board for semiconductor wafer and magnetic recording medium formed with a wiring layer and inter-layer insulating film in the surface.
申请公布号 JP3107546(B2) 申请公布日期 2000.11.13
申请号 JP19990004929 申请日期 1999.01.12
申请人 发明人
分类号 B24B21/00;G11B5/84;H01L21/304;(IPC1-7):B24B21/00 主分类号 B24B21/00
代理机构 代理人
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