发明名称 |
Ferroelectric memory structure is produced by forming vias and conductive structures for connecting short-circuit transistors to upper capacitor electrodes |
摘要 |
Ferroelectric memory structure production, comprising formation of vias and conductive structures for connecting short-circuit transistors to upper capacitor electrodes, is new. A ferroelectric memory structure is produced by: (a) preparing a substrate with several memory cells, each comprising selection and short-circuit transistors connected to a first electrode of a ferroelectric capacitor; (b) applying an electrically insulating layer; (c) producing a contact hole for connection to the second capacitor electrodes; (d) producing contact holes for connection of the short-circuit transistors; (e) filling the contact holes with conductive material; and (f) applying and structuring a conductive layer so that the second capacitor electrodes are connected to the short-circuit transistors.
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申请公布号 |
DE19929308(C1) |
申请公布日期 |
2000.11.09 |
申请号 |
DE19991029308 |
申请日期 |
1999.06.25 |
申请人 |
SIEMENS AG |
发明人 |
SCHINDLER, GUENTHER;BERGMANN, RENATE;DEHM, CHRISTINE;ROEHR, THOMAS;BRAUN, GEORG;HOENIGSCHMID, HEINZ |
分类号 |
H01L21/8246;H01L27/115;(IPC1-7):H01L21/823;H01L27/105 |
主分类号 |
H01L21/8246 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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