发明名称 |
Verfahren zum Strukturieren einer Metall- oder Metallsilizidschicht sowie ein mit diesem Verfahren hergestellter Kondensator |
摘要 |
The invention relates to a method of producing a high-epsilon dielectric/ferroelectric capacitor. According to the inventive method, a structural layer (10) with a central base-layer zone (11) and a trench (13) that is filled with Si and that laterally surrounds said layer is produced. A metal layer (14) is deposited on said layer and is siliconized above the Si-filled trench (13). When the siliconized metal layer section (18) is oxidized, it migrates into the trench (13), thereby forming a base electrode (19) above the base-layer zone (11).
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申请公布号 |
DE19919110(A1) |
申请公布日期 |
2000.11.09 |
申请号 |
DE19991019110 |
申请日期 |
1999.04.27 |
申请人 |
SIEMENS AG |
发明人 |
WEINRICH, VOLKER;SCHINDLER, GUENTHER;MAZURE-ESPEJO, CARLOS |
分类号 |
H01L21/28;H01L21/02;H01L21/3213;H01L21/768;H01L21/822;H01L21/8246;H01L27/04;H01L27/06;H01L27/105;(IPC1-7):H01L21/321 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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