发明名称 Verfahren zum Strukturieren einer Metall- oder Metallsilizidschicht sowie ein mit diesem Verfahren hergestellter Kondensator
摘要 The invention relates to a method of producing a high-epsilon dielectric/ferroelectric capacitor. According to the inventive method, a structural layer (10) with a central base-layer zone (11) and a trench (13) that is filled with Si and that laterally surrounds said layer is produced. A metal layer (14) is deposited on said layer and is siliconized above the Si-filled trench (13). When the siliconized metal layer section (18) is oxidized, it migrates into the trench (13), thereby forming a base electrode (19) above the base-layer zone (11).
申请公布号 DE19919110(A1) 申请公布日期 2000.11.09
申请号 DE19991019110 申请日期 1999.04.27
申请人 SIEMENS AG 发明人 WEINRICH, VOLKER;SCHINDLER, GUENTHER;MAZURE-ESPEJO, CARLOS
分类号 H01L21/28;H01L21/02;H01L21/3213;H01L21/768;H01L21/822;H01L21/8246;H01L27/04;H01L27/06;H01L27/105;(IPC1-7):H01L21/321 主分类号 H01L21/28
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