发明名称 Process for producing semiconductor substrate
摘要 In a process for producing a semiconductor substrate, comprising sealing surface pores of a porous silicon layer and thereafter forming a single-crystal layer on the porous silicon layer by epitaxial growth, intermediate heat treatment is carried after the sealing and out before the epitaxial growth and at a temperature higher than the temperature at the time of the sealing. This process improves crystal quality of the semiconductor substrate having the single-crystal layer formed by epitaxial growth and improves smoothness at the bonding interface when applied to bonded wafers and this process enables to detect the smaller particles on the surface by laser light scattering method. <IMAGE> <IMAGE>
申请公布号 EP0996145(A3) 申请公布日期 2000.11.08
申请号 EP19990307014 申请日期 1999.09.03
申请人 CANON KABUSHIKI KAISHA 发明人 SATO, NOBUHIKO
分类号 H01L21/20;H01L21/205;H01L21/3063;H01L21/762;(IPC1-7):H01L21/20;H01L21/324 主分类号 H01L21/20
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