发明名称 Method of sensing access positions of arm
摘要 In an arm access position sensing method according to the present invention, optical sensors are provided in a cassette chamber. An adjusting cassette holding wafers W in the top slot and bottom slot is placed on a stage in the cassette chamber. The stage is movable. In a calibration process, the reference slot position, map position, and map thickness are calculated using optical sensors. Similarly, in a mapping process, the sampling thickness and map wafer offset value of each slot in the cassette holding the wafers W are calculated. In an arm access position sensing process, the access position of the transfer arm is calculated using the sampling thickness, map wafer offset value, reference slot position, map position, map thickness, and specific values. On the basis of the access position, the transfer arm and stage are actuated to transfer the wafer W.
申请公布号 US6144926(A) 申请公布日期 2000.11.07
申请号 US19980064003 申请日期 1998.04.21
申请人 TOKYO ELECTRON LIMITED 发明人 ISHIZAWA, SHIGERU;MATSUSHIMA, KEIICHI
分类号 H01L21/677;G05B19/401;H01L21/68;(IPC1-7):G06F19/00 主分类号 H01L21/677
代理机构 代理人
主权项
地址