发明名称 Semiconductor substrate and method of manufacturing the same
摘要 A manufacturing method excellent in controllability, productivity and economics of a high-quality SOI wafer and a wafer manufactured by that method are provided. After wafer bonding, separation is made on an interface of a high porosity layer in a porous region including a low porosity layer and the high porosity layer in a surface formed on a main surface side of a first Si substrate 2 to transfer a non-porous layer onto a second substrate. After separation at the high porosity layer, a residual low porosity thin layer is made non-porous by a smoothing process such as hydrogen annealing without using selective etching.
申请公布号 US6143628(A) 申请公布日期 2000.11.07
申请号 US19980047326 申请日期 1998.03.25
申请人 CANON KABUSHIKI KAISHA 发明人 SATO, NOBUHIKO;YONEHARA, TAKAO;SAKAGUCHI, KIYOFUMI
分类号 H01L21/20;(IPC1-7):H01L21/30;H01L21/46 主分类号 H01L21/20
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