发明名称 Semiconductor device and method of fabricating the same
摘要 PCT No. PCT/JP97/00473 Sec. 371 Date Aug. 20, 1998 Sec. 102(e) Date Aug. 20, 1998 PCT Filed Feb. 20, 1997 PCT Pub. No. WO97/31394 PCT Pub. Date Aug. 28, 1997The present invention is characterized, in a semiconductor device with a semiconductor element sealed by resin, in that a metallic foil is bonded through adhesive to the bottom of a lead frame with the semiconductor element mounted thereon, and another metallic foil is fixed to the outer surface of the sealing resin on the side of the semiconductor element. Such a configuration provides a semiconductor device free from warp. In addition, the effect of no warp and metallic foils on the upper and lower surfaces of the semiconductor device provides a reliable semiconductor device with excellent heat dissipation, less influence from moisture absorption and high thermal stress resistance.
申请公布号 US6144108(A) 申请公布日期 2000.11.07
申请号 US19980125523 申请日期 1998.08.20
申请人 NITTO DENKO CORPORATION 发明人 OHIZUMI, SHINICHI;HOTTA, YUJI;KONDO, SEIJI
分类号 H01L23/28;C09J179/00;H01L21/56;H01L23/00;H01L23/16;H01L23/31;H01L23/433;(IPC1-7):H01L23/29;H01L23/48 主分类号 H01L23/28
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