发明名称 Methods of forming electrically conductive interconnections and electrically interconnected substrates
摘要 Methods of forming electrically conductive interconnections and electrically interconnected substrates are described. In one implementation, a first substrate having an outer surface is provided and a layer of material is formed thereover. Openings are formed within the layer of material and conductive masses are formed within the openings. A second substrate having conductive interconnect surfaces is provided. The conductive interconnect surfaces are then contacted with the conductive masses and deformed thereby. In one aspect, the interconnect surfaces are deformed in part by portions of the layer of material proximate the conductive masses. In another aspect, the layer of material is removed and the interconnect surfaces are deformed by the conductive masses themselves.
申请公布号 US6143639(A) 申请公布日期 2000.11.07
申请号 US19990429877 申请日期 1999.10.29
申请人 MICRON TECHNOLOGY, INC. 发明人 MEDLEN, CURTIS M.;TUTTLE, MARK E.
分类号 B23K20/02;B23K20/16;H01L21/60;H05K3/32;(IPC1-7):H01L21/50;H01L21/44;H01L23/48;B23K20/00;B23K20/12 主分类号 B23K20/02
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