发明名称 Method for manufacturing semiconductor device and semiconductor device manufacturing apparatus
摘要 A method of manufacturing a semiconductor device contains a first treatment step of removing a silicon oxide film on a semiconductor substrate (15) in a rare hydrofluoric acid treatment device (12), a second treatment step of forming hemispherical grained silicon on the semiconductor substrate (15) in an HSG-Si forming device (13), and a step of moving the semiconductor substrate (15) treated in the first treatment step to the HSG-Si forming device (13) by means of a semiconductor substrate moving device (14), wherein filtering an air in the semiconductor substrate moving device (14) is conducted so that an amount of organic materials which adhere onto a surface of the semiconductor substrate (15) during a process to the second treatment step is set to 1 ng/cm2 or less.
申请公布号 US6143619(A) 申请公布日期 2000.11.07
申请号 US19980116899 申请日期 1998.07.17
申请人 NEC CORPORATION 发明人 OKAMURA, KENJI;FUJIWARA, SHUJI;KATUYAMA, TAKAO
分类号 H01L27/04;C23C16/02;C23C16/24;C23C16/44;H01L21/02;H01L21/205;H01L21/822;H01L21/8242;H01L27/108;(IPC1-7):H01L21/20 主分类号 H01L27/04
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