发明名称 |
Method for manufacturing semiconductor device and semiconductor device manufacturing apparatus |
摘要 |
A method of manufacturing a semiconductor device contains a first treatment step of removing a silicon oxide film on a semiconductor substrate (15) in a rare hydrofluoric acid treatment device (12), a second treatment step of forming hemispherical grained silicon on the semiconductor substrate (15) in an HSG-Si forming device (13), and a step of moving the semiconductor substrate (15) treated in the first treatment step to the HSG-Si forming device (13) by means of a semiconductor substrate moving device (14), wherein filtering an air in the semiconductor substrate moving device (14) is conducted so that an amount of organic materials which adhere onto a surface of the semiconductor substrate (15) during a process to the second treatment step is set to 1 ng/cm2 or less. |
申请公布号 |
US6143619(A) |
申请公布日期 |
2000.11.07 |
申请号 |
US19980116899 |
申请日期 |
1998.07.17 |
申请人 |
NEC CORPORATION |
发明人 |
OKAMURA, KENJI;FUJIWARA, SHUJI;KATUYAMA, TAKAO |
分类号 |
H01L27/04;C23C16/02;C23C16/24;C23C16/44;H01L21/02;H01L21/205;H01L21/822;H01L21/8242;H01L27/108;(IPC1-7):H01L21/20 |
主分类号 |
H01L27/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|