| 摘要 |
PROBLEM TO BE SOLVED: To provide a test circuit and test method for semiconductor devices capable of function tests and d-c tests and enable an LSI tester with a few of pins to test. SOLUTION: A test circuit for multi-pin type LSIs designed for boundary scan tests comprises a control circuit 5, input buffer d-c test circuits 1p-1r, output buffer d-c test circuits 2p-2r and a d-c test judging circuit 6 whereby d-c tests can be made at input buffers 11p-11r and output buffers 12p-12r, without directly connecting external input/output terminals 5A3, 5B3 to tester pins 71l-71m.
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