发明名称 |
Molten metal probe |
摘要 |
A molten metal probe which is dipped into molten metal and thereafter pulled up therefrom and which is capable of preferably providing solidification temperature data of the molten metal and providing a solidified sample. A probe main body includes an introductory path facing a flow inlet formed at a side portion thereof, a communicating path and a sampling path branched respectively upwardly and downwardly from the introductory path, a temperature measuring chamber communicated with the communicating path extended upwardly, a sampling chamber communicated with the sampling path extended downwardly, and a temperature sensor facing the temperature measuring chamber.
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申请公布号 |
US6142664(A) |
申请公布日期 |
2000.11.07 |
申请号 |
US19980222913 |
申请日期 |
1998.12.30 |
申请人 |
KAWASO ELECTRIC INDUSTRIAL KABUSHIKI KAISHA |
发明人 |
IKAWA, OSAMU;IWAMOTO, YASUNORI |
分类号 |
G01N1/10;G01K13/12;G01N1/12;G01N33/20;(IPC1-7):G01K1/12 |
主分类号 |
G01N1/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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