发明名称 |
CMOS INVERTER AND STANDARD CELL USING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To prevent voids caused by electro-migration in a CMOS inverter. SOLUTION: A power source wiring 11 is connected to the source of a p- channel MOS transistor TR1 via a first contact 12, and a ground wiring 13 is connected to the source of an n-channel MOS transistor TR2 via a second contact 14. One end of a first output signal line 15 is connected to the drain of the p-channel MOS transistor TR1 via a third contact 16, while the other end connected to the drain of the n-channel MOS transistor TR2 via a fourth contact 17. One end of a second output signal line 18 is connected to the fourth contact 17, while the other end extends toward an inverter output end. A first path of an input signal line 19 is connected to a gate electrode 20 of the p- channel MOS transistor TR1 via a fifth contact 21, while a second path is connected to a gate electrode 20 of the n-channel MOS transistor TR2 via a sixth contact 22. |
申请公布号 |
JP2000311952(A) |
申请公布日期 |
2000.11.07 |
申请号 |
JP19990119290 |
申请日期 |
1999.04.27 |
申请人 |
MATSUSHITA ELECTRONICS INDUSTRY CORP |
发明人 |
DOMAE SHINICHI;UEDA TETSUYA |
分类号 |
H01L21/8238;H01L21/3205;H01L21/822;H01L23/52;H01L27/04;H01L27/092;(IPC1-7):H01L21/823;H01L21/320 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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