| 摘要 |
<p>PROBLEM TO BE SOLVED: To realize a logic integrated circuit provided with built-in functional modules, where the functional modules can be efficiently tested by additionally providing a testing circuit of small scale. SOLUTION: Functional modules, which are each composed of a plurality of circuit blocks are built in a semiconductor integrated circuit, where a clock feed/cut-off circuit 18 which cuts off clocks that are fed to a circuit block provided in a certain module in a test mode, is provided in the module which is required to be tested. By this setup, a semiconductor integrated circuit can be improved in testing, enhanced in fault detection rate, and circuit reliability efficiency preventing a test circuit from increasing in circuit scale.</p> |
