发明名称 |
Setup for testing an integrated circuit in a semiconductor chip wherein the temperature of the semiconductor chip is controlled |
摘要 |
A test setup for testing an integrated circuit. A holder is provided which is capable of releasably receiving and holding the integrated circuit. Apparatus is provided which tests the integrity of the integrated circuit. A controller is provided which controls the temperature of the integrated circuit.
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申请公布号 |
US6144215(A) |
申请公布日期 |
2000.11.07 |
申请号 |
US19980059530 |
申请日期 |
1998.04.13 |
申请人 |
INTEL CORPORATION |
发明人 |
MAXWELL, MARTIN M.;WEINSTEIN, DAN |
分类号 |
G01R31/28;(IPC1-7):G01R1/073;G01R31/26 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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