发明名称 Metalliseringspatroon voor een halfgeleiderinrichting, en werkwijze voor het vervaardigen daarvan.
摘要 Structure and method for metallization patterns of different thicknesses on a semiconductor device or integrated circuit. The improved structure and method utilizes three layers of metal in order to reduce the required number of processing steps. One preferred embodiment entails a single metal deposition sequence followed by two etch steps, while a second embodiment, suitable for thicker metallization, requires only two depositions and two etch steps.
申请公布号 NL193808(C) 申请公布日期 2000.11.06
申请号 NL19850003486 申请日期 1985.12.18
申请人 SGS MICROELETTRONICA S.P.A. 发明人
分类号 H01L23/52;H01L21/28;H01L21/3205;H01L23/532;(IPC1-7):H01L21/768;H01L29/43;H01L29/41 主分类号 H01L23/52
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