发明名称 POLISHING APPARATUS HAVING COOLING PAD AND POLISHING METHOD USING THE SAME
摘要 PURPOSE: A polishing apparatus having a cooling pad and a polishing method using the same are provided to ensure a wafer production yield at a low cost with a high efficiency and a high productivity by not using a slurry. CONSTITUTION: CMP(Chemical Mechanical Polishing) device is used to polish a material layer formed on a wafer by using a low-temperature chemical polishing process. A polished wafer is mounted to a bottom of the CVD. During the polishing process, a wafer temperature and a pressure applied to a backside of the wafer can be uniformly maintained. The cooling pad is positioned to a position facing the wafer head. A surface is planarized to be proper for a wafer polishing. A chemical needed for the polishing is self-provided during the polishing process. A cooling container encloses a bottom and a side of the cooling pad. The cooling part is mounted to a bottom of the cooling container, and is used to form the cooling pad. The CMP device further includes a chamber having no moisture. Thereby, the polishing apparatus ensures a wafer production yield at a low cost with a high efficiency and a high productivity by not using a slurry.
申请公布号 KR20000064128(A) 申请公布日期 2000.11.06
申请号 KR20000048870 申请日期 2000.08.23
申请人 FINE SEMITECH CO., LTD. 发明人 PARK, SEONG YONG
分类号 H01L21/302;B24B37/04;B24B49/14;H01L21/306;H01L21/3105;H01L21/321;(IPC1-7):H01L21/302 主分类号 H01L21/302
代理机构 代理人
主权项
地址