发明名称 Verfahren zur Herstellung einer abgeschiedenen epitaxialen Si-Schicht mittels Zerstäubung
摘要 A method for forming a deposited film by a bias sputtering process comprises the steps of generating plasma between a target electrode holding a target material provided in a vacuum container and a substate electrode holding a substrate for forming deposited film, provided opposingly to the target electrode, by the use of a high-frequency energy to cause the target material to undergo sputtering, and applying a bias voltage to at least one of the target electrode and the substate electrode to form a deposited film comprised of atoms having deposited by sputtering on the substrate, wherein; a mixed-gas environment comprising a mixture of an inert gas and a hydrogen gas is formed in the vacuum container, and the target material is subjected to sputtering while controlling H2O gas, CO gas and CO2 gas in the mixed-gas environment to have a partial pressure of 1.0 x 10<-><8> Torr or less each, to form an epitaxial film on the substrate while maintaining a substrate temperature in the range of from 400 DEG C to 700 DEG C. <IMAGE>
申请公布号 DE69329483(D1) 申请公布日期 2000.11.02
申请号 DE1993629483 申请日期 1993.12.06
申请人 CANON K.K., TOKIO/TOKYO 发明人 ICHIKAWA, TAKESHI
分类号 C23C14/34;C23C14/54;C30B23/02;C30B23/08;H01L21/20;H01L21/203;H01L21/306;H01L21/331;H01L29/73;(IPC1-7):H01L21/203 主分类号 C23C14/34
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