发明名称 Voltage detection circuit for use in semiconductor memory component, includes compensation current generation section for preventing potential of signalling line VPP from rising steeply
摘要 A compensation current generation section (141) provided for preventing the potential of signalling line VPP from rising steeply, comprises NMOS transistors (246-250), metal line (251) and fuse elements (253,254). A compensation current is delivered to the fuse elements, and to the node (256) via the NMOS transistor (246) in accordance with the value of current which flows through the NMOS transistor (241) so that the potential of signalling line VPP rises slowly.
申请公布号 DE19961135(A1) 申请公布日期 2000.11.02
申请号 DE19991061135 申请日期 1999.12.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEON, BAEK-YEONG
分类号 H01L27/04;G05F3/24;G11C5/14;G11C11/407;H01L21/822;H03K5/08;(IPC1-7):G11C5/14;H02M3/07 主分类号 H01L27/04
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