发明名称 |
Semiconductor device simulating apparatus, simulates and outputs current value based on input test signal and various parameters |
摘要 |
A setting unit sets various parameters to measure voltage or current value which changes due to internal resistance of semiconductor device. An input unit inputs the test signal to examined semiconductor device. Based on test signal and parameter, a simulating unit simulates and outputs current value. An Independent claim is also included for program debug apparatus for semiconductor testing.
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申请公布号 |
DE10010043(A1) |
申请公布日期 |
2000.11.02 |
申请号 |
DE20001010043 |
申请日期 |
2000.03.02 |
申请人 |
ADVANTEST CORP., TOKIO/TOKYO |
发明人 |
FUKUSHIMA, KIYOSHI |
分类号 |
G06F11/22;G01R31/28;G01R31/30;G01R31/317;G01R31/3183;G06F17/50;H01L29/00;(IPC1-7):G06F11/00;G01R31/318 |
主分类号 |
G06F11/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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