发明名称 ELECTROMAGNETIC WAVE GENERATING SOURCE PROBING DEVICE, METHOD THEREFOR AND ANALYZING METHOD THEREFOR
摘要 An electromagnetic wave generating source probing device capable of probing and identifying, with a high accuracy and at a high speed, a generating source (of an electromagnetic disturbing wave) mainly causing an electromagnetic field generated remote from the device, and a method therefor, and an electromagnetic wave generating source analyzing system and a method therefor. The probing method is characterized in that a magnetic field near an object of measurement (110) is measured by at least two probe sets (101, 102), the position of an electromagnetic wave generating source is probed using a simple calculation consisting of one function of a phase difference between the two probes, a simultaneous equation including this position information and the magnitude of the measured magnetic field is solved to determine a current distribution of the object of measurement, and an electromagnetic field remote from the device is determined by calculation from the current distribution to thereby identify a generating source mainly causing an electromagnetic field generated remote from the device.
申请公布号 WO0065362(A1) 申请公布日期 2000.11.02
申请号 WO2000JP02623 申请日期 2000.04.21
申请人 HITACHI, LTD. 发明人 UESAKA, KOUICHI;SHINBO, KENICHI
分类号 G01R29/08;(IPC1-7):G01R29/08;G01B7/00;G01S5/12 主分类号 G01R29/08
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