发明名称 METHOD FOR FORMING MAGNETORESISTANCE EFFECT FILM
摘要 A method for forming a magnetoresistance effect film, enabling manufacture of a magnetoresistive device having a high MR ratio by improving the flatness of the interfaces between layers without deteriorating the crystallinity of a multilayer film. The method for forming a magnetoresistance effect film including a free magnetization layer, a nonmagnetic layer, a fixed magnetization layer, and an antiferromagnetic layer on a predetermined substrate in order of mention or in the reverse order is characterized by comprising at least the step of disposing the substrate in a film-forming chamber, lowering the ultimate degree of vacuum in the film-forming chamber below 10<-10> Torr, introducing at least an oxygen-containing gas (a) into the film-forming chamber, changing the degree of vacuum in the film-forming chamber to a constant pressure in a range from 3x10<-9> Torr to 1x10<-8> Torr, introducing a gas (b) consisting of Ar, and sputtering a predetermined target using a mixture of the gases (a, b), so as to form the free magnetization layer under the nonmagnetic layer or forming both the fixed magnetization layer and the nonmagnetic layer.
申请公布号 WO0065614(A1) 申请公布日期 2000.11.02
申请号 WO1999JP02148 申请日期 1999.04.22
申请人 TAKAHASHI, MIGAKU;UNEYAMA, KAZUHIRO;YAGAMI, KOUJIROU;TSUNODA, MASAKIYO 发明人 TAKAHASHI, MIGAKU;UNEYAMA, KAZUHIRO;YAGAMI, KOUJIROU;TSUNODA, MASAKIYO
分类号 H01F10/32;H01F41/30;H01L43/12;(IPC1-7):H01F41/18 主分类号 H01F10/32
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