发明名称 TEST DEVICE FOR CIRCUIT-BREAKER
摘要 <p>PROBLEM TO BE SOLVED: To provide a test device capable of imitaing breaking phenomenon of a second phase and a third phase in a single body test of a circuit-breaker by a Weil synthetic test method. SOLUTION: In a Weil synthetic test device which supplies a short current to a sample circuit-breaker 6 from a current source circuit to apply a restoration voltage from a voltage source circuit when a current of the sample circuit- breaker is broken, a capacitor 21 is initially charged in a direct current charging device 22, a reactor 23 for generating a vibration current between the capacitor 21 and it is connected in series, and an auxiliary circuit-breaker 24 is turned on during a period of breaking current of a final half wave of the sample circuit-breaker. Consequently, a positive or negative vibration current of half cycle period generated in a series circuit of the capacitor 21 and the reactor 23 is superimposed on a breaking current of the sample circuit-breaker to obtain a breaking current wave shape imitating breaking current wave shapes IE, IR of a second phase and a third phase strictly.</p>
申请公布号 JP2000304835(A) 申请公布日期 2000.11.02
申请号 JP19990114400 申请日期 1999.04.22
申请人 MEIDENSHA CORP 发明人 FURUHATA TAKAAKI;SHIOZAKI MITSUYASU
分类号 G01R31/327;G01R31/333;H01H9/54;(IPC1-7):G01R31/327 主分类号 G01R31/327
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