| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a method and an apparatus for grading of tea leaves in which the measuring time of the component of the tea leaves is shortened and in which a grading treatment can be performed quickly. SOLUTION: A specific component which is required for grading tea leaves 2 is specified in advance. The wavelength of near-infrared rays 12 (an absorbanceλ1, an absorbanceλ2 and an absorbanceλ3 at a specific wavelength) corresponding to the component is selected. Near-infrared rays at the specific wavelength are selected and detected from reflected light 38 or transmitted light from the tea leaf. The detection value is used for the grading of the tea leaf. Near-infrared detection means (interference filters 40, 44 and PbS detectors 42, 46) can detect only the specific wavelength, and the near-infrared detection means are installed at a plurality of specific wavelengths. As a result, the measuring time of the component of the tea leaves is shortened, and a grading treatment can be realized quickly.</p> |
