发明名称 PLASMA TREATMENT APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a plasma treatment apparatus, capable of efficiently generating a self-bias potential and performing highly accurate surface treatment, even when a sufficiently large ground area cannot be secured compared with an area of a wafer to be treated. SOLUTION: This plasma treatment apparatus is composed of a vacuum chamber 1, which is connected to a vacuum pumping device and can reduce pressure inside, a gas supply device 4 for supplying gases into the vacuum chamber 1, means for generating plasma in the vacuum chamber 1, a wafer 10 to be treated, a wafer electrode 9 capable of placing thereon the wafer 10 to be treated, a high-frequency power source 12 for supplying high-frequency power to the wafer electrode 9, a matching circuit 11 connected between the wafer electrode 9 and the high-frequency power source 12 and a ground electrode 8 provided in the vacuum chamber 1. The wafer electrode 9 is grounded via a potential adjusting mechanism. Consequently, even when the ground electrode area is smaller than the wafer to be treated, a sufficient self-bias potential can be generated. Since ions in plasma are injected efficiently into material to be treated, highly accurate surface treatment can be performed.
申请公布号 JP2000306891(A) 申请公布日期 2000.11.02
申请号 JP19990114558 申请日期 1999.04.22
申请人 HITACHI LTD 发明人 KADOYA MASAHIRO;TAMURA HITOSHI;WATANABE SEIICHI
分类号 H01L21/302;C23F4/00;H01L21/3065;H05H1/46 主分类号 H01L21/302
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