发明名称 DRY ETCHING SYSTEM
摘要 PROBLEM TO BE SOLVED: To improve temperature adjustment for a shower plate and implement uniform diffusion of a process gas by performing dry etching, while arranging upper and lower electrodes within an etching chamber, with the upper electrode having a cooling chamber and a gas diffusion chamber formed therein and the lower electrode serving to fixedly support a wafer. SOLUTION: A high-frequency voltage is applied to an upper electrode 2 arranged within an etching chamber, and a high-frequency bias is applied to a lower electrode on which a wafer is mounted. Upon application of the high-frequency voltage to the electrode 2, electromagnetic waves are radiated within the etching chamber to generate a plasma. At this time, the electrode 2 is heated, resulting in raised temperature. Within the electrode 2, a cooling chamber 7 and a gas diffusion chamber 8 are formed and a shower plate 12 is fixed in contact with the chamber 7. Therefore, a coolant cools the chamber 7 and exchanges heat with the plate 12, whereby temperature adjustment can be made. Furthermore, a process gas is diffused uniformly within the etching chamber from nozzles 11 via entrances 10 and the chamber 8.
申请公布号 JP2000306889(A) 申请公布日期 2000.11.02
申请号 JP19990113185 申请日期 1999.04.21
申请人 HITACHI LTD 发明人 KANEKIYO HIROSHI;SUEHIRO MITSURU;FUJIMOTO TETSUO;MATANO KATSUJI
分类号 H01L21/302;C23F4/00;H01L21/3065;H05H1/46 主分类号 H01L21/302
代理机构 代理人
主权项
地址