发明名称 |
METHOD FOR ETCHING TITANIUM NITRIDE OF SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: An etching method of a titanium nitride is provided to improve an etching selectivity and an etching profile of the titanium nitride(TiO2) by using Cl2 gas. CONSTITUTION: The titanium nitride(TiO2) film is used as an anti-diffusion layer after depositing a ferroelectric film, such as BST or PZT. The titanium nitride(TiO2) is etched by using a plasma containing chlorine radicals. The plasma containing chlorine radicals is used of Cl2 gases. The plasma further comprises an inert gas. Also, the titanium nitride is etched by the Cl2 gas of less than 200 sccm.
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申请公布号 |
KR100265836(B1) |
申请公布日期 |
2000.11.01 |
申请号 |
KR19970027844 |
申请日期 |
1997.06.26 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD |
发明人 |
KIM, JEONG HO;KIM, JIN WUNG |
分类号 |
H01L21/30;(IPC1-7):H01L21/30 |
主分类号 |
H01L21/30 |
代理机构 |
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地址 |
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