发明名称 Ion-trap mass analyzing apparatus and ion trap mass analyzing method
摘要 An numerical analysis time which is assigned to mass select one ion species having a specific mass-to-charge ratio mass selected is divided into the first part time and the second part time, and a dipole auxiliary electric field capable of spatially reducing a spread is superimposed in the first part time of the numerical analysis time and a quadrupole auxiliary voltage capable of rapidly emitting ions when position coordinates are large is superimposed in the second part of the time. Therefore, the initial spatial spread is reduced in the first part time and the trajectories of ions is rapidly amplified in the second part time, and the ions are emitted. Thus, the entire mass sweep time can be reduced and a high-resolution numerical analysis can be accelerated.
申请公布号 US6140641(A) 申请公布日期 2000.10.31
申请号 US19980089088 申请日期 1998.06.02
申请人 HITACHI, LTD. 发明人 YOSHINARI, KIYOMI;OSE, YOICHI;KATO, YOSHIAKI;NAKAGAWA, KATSUHIRO
分类号 G01N27/62;H01J49/26;H01J49/42;(IPC1-7):H01J49/00 主分类号 G01N27/62
代理机构 代理人
主权项
地址