发明名称 Exhaust line of chemical-mechanical polisher
摘要 An improved exhaust line of a chemical-mechanical polisher will improve polishing performance. A chemical-mechanical polisher is in a polishing chamber, wherein the chemical-mechanical polisher contains a polishing table, a plurality of polishing pads on the polishing table, and a plurality of outlets on the polishing table. A plurality of exhaust lines is connected with the plurality of the outlets, wherein the exhaust lines are used to drive out exhaust gas and sewage generated in the polishing chamber. At least a gas-liquid separating device is connected with the plurality of the exhaust lines, wherein the gas-liquid separating device is used for separation of the exhaust and the sewage. The gas-liquid separating device comprises a sewage collector, a filter, a pump, and a sewage-collecting device. The sewage collector is connected with the plurality of the outlets, wherein the sewage collector is used for collecting the exhaust gas and the sewage driven out through the plurality of outlets. The filter is connected with the top of the gas-liquid separating device. The pump is connected with the filter. The sewage-collecting device is connected with the bottom of the gas-liquid separating device, wherein the sewage-collecting device is used for collecting the sewage.
申请公布号 US6139680(A) 申请公布日期 2000.10.31
申请号 US19980212371 申请日期 1998.12.15
申请人 UNITED MICROELECTRONICS CORP. 发明人 CHEN, CHIEN-HUNG;CHEN, HSUEH-CHUNG
分类号 B01D46/00;B24B37/04;B24B55/12;(IPC1-7):C23F1/02 主分类号 B01D46/00
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