发明名称 |
SAMPLE EXPERIMENTING APPARATUS AND SAMPLE HOUSING STRUCTURE |
摘要 |
PROBLEM TO BE SOLVED: To simplify the work to recover and supply a sample and to shorten working time. SOLUTION: This device has a sample release mechanism 100 which releases the sample 101 to a suspension region S between electrodes 106 (106a and 106b). This sample release mechanism 100 is capable of holding and releasing the sample 100 and is arranged near the electrodes 106 in the state of holding the sample 100. The mechanism is so constituted as to electrify the sample 100, to release the electrified sample 100 from a sample holding part 108 and to release the sample by electrostatic force between the electrodes 106 to the suspension region S.
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申请公布号 |
JP2000301007(A) |
申请公布日期 |
2000.10.31 |
申请号 |
JP19990113821 |
申请日期 |
1999.04.21 |
申请人 |
MITSUBISHI ELECTRIC CORP;NATL SPACE DEVELOPMENT AGENCY OF JAPAN |
发明人 |
SHIMOJI HARUHIKO;FUKUSHIMA KAZUHIKO;YUZAWA MARI;IKEDA TOSHITAMI;KARASAWA HIROKI |
分类号 |
B64G1/66;B01L99/00;G01N1/00;G01N1/28;(IPC1-7):B01L11/00 |
主分类号 |
B64G1/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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