发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND MANUFACTURING LINE THEREOF |
摘要 |
A manufacturing line of a semiconductor in which a semiconductor wafer having a diameter of 6 inches (150 +/- 3mm : SEAJ standards) is used and the wafer is subjected to a series of processings to form an integrated circuit on the wafer. The manufacturing line comprises two sub-lines having the same specifications. Each sub-line is constituted by a series of processing apparatuses including a film-forming device, a pattern aligner, an etching device and a test device. At least an aligner and an etching device can perform microlithographic patterning of 0.3 mu m or less. A semiconductor device manufacturing method including means for transferring a semiconductor wafer under processing between the two sub-lines and capable of handling a plurality of wafer sizes, and its manufacturing line are provided.
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申请公布号 |
WO0063953(A1) |
申请公布日期 |
2000.10.26 |
申请号 |
WO2000JP02351 |
申请日期 |
2000.04.11 |
申请人 |
TOKYO ELECTRON LIMITED;INOUE, JUNICHI;ASAKAWA, TERUO;SUGIYAMA, KAZUHIKO |
发明人 |
INOUE, JUNICHI;ASAKAWA, TERUO;SUGIYAMA, KAZUHIKO |
分类号 |
C23C14/56;C23C16/54;H01L21/00;H01L21/04;(IPC1-7):H01L21/02 |
主分类号 |
C23C14/56 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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