发明名称 METHOD FOR TESTING ELECTRODE LEAK OF DISCHARGE TUBE AND CATHODE RAY TUBE
摘要 PURPOSE: A method for testing an electrode leak of discharge tube and a cathode ray tube is provided to examine inferiority of an electric gun by finding exact location of an emitter. CONSTITUTION: In a method for testing an electrode leak of discharge tube and a cathode ray tube, a testing device includes a plurality of jigs(4a)(4b) installed on a mounting pad(2) and connected with each other by a belt(6). A jig(4a) installs a cathode ray tube(C) including a leak-generated electric gun, and the other jig(4b) installs a sample electrode(SG). A linker(8) which can reciprocate is installed in the mounting pad(2), and has a pair of laser(10a)(10b). The method includes the steps of setting the cathode ray tube(C) on a jig(4a) and the sample electrode(SG) on the other jig(4b). Here, the two jigs are connected with each other, so as to rotate in the same angle at the same time. Next, acknowledge a luminous point from a leak generation with naked eyes by impressing a voltage on the cathode ray tube(C) and appoint a location on the luminous point by a laser of one side. Accordingly, a location on the sample electrode(SG) is equally appointed by moving of a laser of the other side. Finally, appoint the same location of an electrode of the cathode ray tube(C) with the luminous point of the sample electrode(SG) by disjointing the tube(C), then analyze using an electron microscope and a component analyzer.
申请公布号 KR20000061840(A) 申请公布日期 2000.10.25
申请号 KR19990011218 申请日期 1999.03.31
申请人 SAMSUNG SDI CO., LTD. 发明人 KANG, DONG HYEON;SONG, IN SIK;CHO, HAE UN
分类号 H01J9/42;(IPC1-7):H01J9/42 主分类号 H01J9/42
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