发明名称 In situ plasma pre-deposition wafer treatment in chemical vapor deposition technology for semiconductor integrated circuit applications
摘要 A method of de-oxidizing a surface onto which a refractory metal or molecule which contains a refractory metal atom will be adhered. The method utilizes a plasma which includes a gas such as argon, nitrogen, helium or hydrogen, or a mixture of any of the foregoing, to remove oxygen molecules from the surface to which adherence of the refractory metal is desired. Radicals in the plasma coat the surface to prevent further oxidation thereof. The method also includes techniques for depositing refractory metals onto a surface such as a substrate or layer of semiconductor material on which integrated circuitry has been fabricated.
申请公布号 US6136690(A) 申请公布日期 2000.10.24
申请号 US19980023523 申请日期 1998.02.13
申请人 MICRON TECHNOLOGY, INC. 发明人 LI, WEIMIN
分类号 H01L21/285;H01L21/768;(IPC1-7):H01L21/476;H01L21/44 主分类号 H01L21/285
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