| 摘要 |
The testing and verification of CDMA cellular base stations requires a number of parameters to be measured. Many of these parameters are measured in the code domain where individual waveforms are extracted from a composite waveform through the use of orthogonal codes. A method and apparatus is described for measuring many code domain parameters using a modified code domain power measurement technique. The apparatus is comprised of a chip timing recovery circuit (46), a reference generator (78), a multiplier (60), various summers and absolute value operations, a memory (76), and a processor (90). In addition, a reference generator (78) for generating an improved reference waveform is described. Reference generator (78) is comprised of a Walsh code generator (200), an I channel PN sequence generator (202), a Q channel PN sequence generator (204), an XOR gate (206), and an XOR gate (208). This improved reference waveform allows for greater code domain parameter measurement accuracy without requiring tighter input frequency tolerances.
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