发明名称 |
Method for manufacturing detector system for a computed tomography apparatus |
摘要 |
In a method for manufacturing a detector system composed of a number of detector elements respectively disposed at installation positions in a computed tomography (CT) apparatus, the detector elements are allocated to respective installation positions on the basis of a table that, for at least one image-relevant physical property, contains at least the allowable upper limit value or the allowable lower limit value for the individual installation positions for the deviation of the property with respect to a detector element occupying a neighboring installation position.
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申请公布号 |
US6137859(A) |
申请公布日期 |
2000.10.24 |
申请号 |
US19990247595 |
申请日期 |
1999.02.10 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
VON DER HAAR, THOMAS;KOHL, GERHARD;BRUDER, HERBERT |
分类号 |
A61B6/03;G01T1/161;G01T1/29;(IPC1-7):G01N23/04 |
主分类号 |
A61B6/03 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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