发明名称 Method for manufacturing detector system for a computed tomography apparatus
摘要 In a method for manufacturing a detector system composed of a number of detector elements respectively disposed at installation positions in a computed tomography (CT) apparatus, the detector elements are allocated to respective installation positions on the basis of a table that, for at least one image-relevant physical property, contains at least the allowable upper limit value or the allowable lower limit value for the individual installation positions for the deviation of the property with respect to a detector element occupying a neighboring installation position.
申请公布号 US6137859(A) 申请公布日期 2000.10.24
申请号 US19990247595 申请日期 1999.02.10
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 VON DER HAAR, THOMAS;KOHL, GERHARD;BRUDER, HERBERT
分类号 A61B6/03;G01T1/161;G01T1/29;(IPC1-7):G01N23/04 主分类号 A61B6/03
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