发明名称 SEMICONDUCTOR CIRCUIT DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To realize a varactor with good satisfactory modulation characteristics that does not cause deterioration at high frequency waves of a transistor. SOLUTION: An emitter layer 51, an emitter intermediate layer 52, an emitter intermediate layer 53, and an emitter/contact layer 54 each has an n-type impurity density that increases sequentially in this order. In a transistor part 10a, a junction capacity of a p-n junction between a p-type base layer 4 and the emitter layer 51 is limited to a low level, to prevent a decrease in high-frequency characteristics. In a varactor part 11a, an anode electrode 104a is formed in the emitter intermediate layer 53 with high impurity density, and a cathode electrode 105a is formed on the emitter layer 51 with low impurity density to constitute a diode with hyperabrupt junction structure. An alloyed region 6a as an ohmic electrode is formed immediately under the cathode electrode 105a.
申请公布号 JP2000299386(A) 申请公布日期 2000.10.24
申请号 JP19990106994 申请日期 1999.04.14
申请人 NEC CORP 发明人 TANAKA SHINICHI
分类号 H01L29/73;H01L21/331;H01L21/822;H01L21/8222;H01L27/04;H01L27/06;H01L29/205;H01L29/737;H01L29/93;(IPC1-7):H01L21/822 主分类号 H01L29/73
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